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February 9, 2012
False Tin Whiskers: Masquerading Intermetallic
Analysis Lab
Cause of Unusual Contamination?
Ask the Experts
Addressing Head-In-Pillow Defects
Analysis Lab
What Causes Oxidation on SMT Pads?
Ask the Experts
The Effects of Flux Residues on Reliability
Analysis Lab
Head and Pillow SMT Failure Modes
Analysis Lab
Elimination of Whiskers from Electroplated Tin
Materials Tech
Fracture Prediction in Lead-Free Joints
Analysis Lab
Mysterious Solder Balls
Ask the Experts
Reducing Defects with Embedded Sensing
Materials Tech
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pH Neutral vs. Alkaline Cleaning Agents
Study compares material compatibility and cleaning effectiveness of pH-neutral and alkaline technologies ...
False Tin Whiskers: Masquerading Intermetallic
Paper covers misidentification of tin/copper intermetallic structures as tin whiskers and soldering ...
Reactions of Sn in the Cu-Sn-Zn Alloy
This paper reports a number of experimentally determined reactions that occur in ...
Embedded Components: Analysis of Reliability
Paper aims at analyzing and confirming the reliability performance of embedded components ...
Lead-free Reflow and Influence of Moisture
This paper examines concerns relating to lead-free reflow, PCB degradation, and the ...
Thermal Cycle Testing of PWBs
Paper establishes a test protocol for thermal cycle testing of bare PWBs ...
Void Detection in Solder Balls and Joints
Paper covers an automatic void detection algorithm. The method is applicable to ...
Addressing Head-In-Pillow Defects
The head-in-pillow defect has become a relatively common failure since the implementation ...
Thermal Shock/Drop Test of Lead-free
Paper has results from experimental research making a comparison of different lead-free ...
The Effects of Flux Residues on Reliability
Paper discusses an experiment designed to mimic partially activated flux residues under ...
More Analysis Lab  »
New High-speed Modular Chip-shooter
New High-speed Modular Chip-shooter
The FX3 is a new high-speed modular chip-shooter delivering cutting edge technology combining speed, performance and high-uptime.
Juki Automation Systems

Head-On-Pillow Defect - A Pain in the Neck *
Head-On-Pillow Defect - A Pain in the Neck *
The head on pillow defect is becoming more common. This paper describes one such occurrence for an OEM and explains how it was dealt with.
Authored By:
Chris Oliphant, Bev Christian, Kishore Subba-Rao, Fintan Doyle, Laura Turbini, David Connell, Jack Q. L. Han
Research In Motion, Waterloo, Ontario, Canada
This program first published September 2010
Analysis Lab programs cover topics including:
Corrosion, Contamination, Data Acquisition, ESD and EOS, Inspection, Measurement, Profiling, Reliability, R&D, RFID, Solder Defects, Test, Tombstoning, X-ray and more.
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