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May 22, 2013
Voiding Control at QFN Assembly
Program: Analysis Lab
Integrated Electrical Test Within the Production Line
Program: Production Floor
X-rays vs. Cross Sections to Measure Voids
Program: Analysis Lab
Fatigue Behaviour of Reflowed Joints
Program: Analysis Lab
Evaluating Surface Cleanliness
Program: Analysis Lab
Boundary Scan Advanced Diagnostic Methods
Program: Production Floor
Pb-Free Thermal Cycle Acceleration Factors
Program: Analysis Lab
Revolutionary Technique for Microvia Microsections
Program: Analysis Lab
Explanation of PoP Inspection Techniques
Program: Analysis Lab
Drop Test Performance of BGA Assemblies
Program: Analysis Lab
Optical Inspection from AOI and AVI Machines
Program: Analysis Lab
Analysis of Voiding Under QFN Packages
Program: Analysis Lab
TDI Imaging: An Efficient AOI and AXI Tool
Program: Analysis Lab
Flux Residue Causing Test Issues
Program: Ask the Experts
Combination of AOI and AVI Machines
Program: Analysis Lab
Effective Test-Probe Assignment
Program: Production Floor
AOI in an 01005 World
Program: Production Floor
Solder Paste Inspection - When and Why
Program: Board Talk
Analysis of Warp-Induced PBGA Joint Failures
Program: Analysis Lab
Using X-ray to Detect Counterfeit Components
Program: Analysis Lab
Should We Invest in 3D Optical Inspection?
Program: Board Talk
Recent Technology Advances for X-ray Inspection
Program: Analysis Lab
How Do You Inspect QFN Components?
Program: Board Talk
2D and CT Scan X-ray for Joint Inspection
Program: Analysis Lab
Guide to Understanding Your Testing Lab
Program: Analysis Lab
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These programs cover manual and automated test, manual and automated optical inspection, x-ray and more.
Voiding Control at QFN Assembly
Voiding Control at QFN Assembly
Thermal pad voiding control at QFN assembly is a major challenge due to the large coverage area, large number of via, and low standoff.
Program: Analysis Lab
Integrated Electrical Test Within the Production Line
Integrated Electrical Test Within the Production Line
This paper discusses the advantages of a universal integrated electrical test solution, at the normal in-circuit test stage of production, to minimize production costs and help improve product quality.
Program: Production Floor
X-rays vs. Cross Sections to Measure Voids
X-rays vs. Cross Sections to Measure Voids
This paper validates void measurements obtained from non-destructive imaging techniques, with the physically measured void measurements of cross sectioning.
Program: Analysis Lab
Fatigue Behaviour of Reflowed Joints
Fatigue Behaviour of Reflowed Joints
This paper explores the behaviour of a copper test vehicle with multiple reflowed solder joints, which has direct relevance to ball grid arrays and high density interconnect structures.
Program: Analysis Lab
Evaluating Surface Cleanliness
Evaluating Surface Cleanliness
The water break test is easy and practical to conduct and helps you evaluate residues left from adhesives or conformal coating dots.
Program: Analysis Lab
Boundary Scan Advanced Diagnostic Methods
Boundary Scan Advanced Diagnostic Methods
In this paper several cases will be presented to illustrate how use of circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.
Program: Production Floor
Pb-Free Thermal Cycle Acceleration Factors
Pb-Free Thermal Cycle Acceleration Factors
Paper discusses the calculation of acceleration factors for different Pb-free solders, comparing results with those for eutectic SnPb.
Program: Analysis Lab
Revolutionary Technique for Microvia Microsections
Revolutionary Technique for Microvia Microsections
This paper describes the design of a novel test structure that facilitates the evaluation of blind and buried microvias in printed circuit boards, in comparison with existing, standard test coupons.
Program: Analysis Lab
Explanation of PoP Inspection Techniques
Explanation of PoP Inspection Techniques
Industry expert Bob Willis explains the three available options of x-ray, optical and process monitoring for inspection of package-on-package assemblies.
Program: Analysis Lab
Drop Test Performance of BGA Assemblies
Drop Test Performance of BGA Assemblies
In this work, BGA solder spheres using SAC105 with 0.02% addition of Titanium were evaluated for BGA assembly drop test performance.
Program: Analysis Lab
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