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June 18, 2013
Evaluation of Molded Flip-chip BGA Packages
Program: Analysis Lab
Gold Stud Bump Flip Chip Attachment
Program: Materials Tech
Challenges of Package on Package Devices
Program: Materials Tech
Assembly of Fine Pitch PoP Components
Program: Production Floor
Embedded Packaging Technologies
Program: Materials Tech
Solder Bumping for Flip Chip Technology
Program: Materials Tech
Flip Chip Package Qualification
Program: Materials Tech
Investigation of Pad Cratering in Large Flip-Chip BGA
Program: Analysis Lab
New Technologies for Ultra Thin Chips
Program: Materials Tech
No-Clean Flux Residue and Underfill Compatibility
Program: Materials Tech
How to Achieve High Speeds Without Breaking the Bank
Program: Production Floor
Design for Flip-Chip and Chip-Size Technology
Program: Materials Tech
Update - The Revolution in MEMS
Program: Technology Briefing
From the Single Chip to Wafer Integration
Program: Materials Tech
Evaluation of POP Assembly Under Load
Program: Production Floor
The Latest in Cheap Micro Surgical Cameras
Program: Technology Briefing
Using Light in New Computer Chips
Program: Technology Briefing
PCB Assembly for 3D Package-on-Package
Program: Production Floor
Advances in Computer Chip Core Technology
Program: Technology Briefing
When Should You Use Underfill?
Program: Board Talk
Memory Minaturazation to Extend Moore's Law
Program: Technology Briefing
Advances in Graphene Transistors
Program: Technology Briefing
The Huge Potential of Micro-Sensors
Program: Technology Briefing
Breakthrough at the Nanoscale
Program: Technology Briefing
Breakthrough - Ultra Low Power Digital Memory
Program: Technology Briefing
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These programs cover flip-chip, chip scale packaging, MEMS, semiconductors and more.
Evaluation of Molded Flip-chip BGA Packages
Evaluation of Molded Flip-chip BGA Packages
The results of this study demonstrate that the molded flip-chip BGA package is a cost effective and high reliability solution for 28nm FPGA devices.
Program: Analysis Lab
Gold Stud Bump Flip Chip Attachment
Gold Stud Bump Flip Chip Attachment
Flip chip bonding is a desirable attachment approach for minimizing size. This paper compares immersion and auto catalytic gold plating processes for flip chip bonding.
Program: Materials Tech
Challenges of Package on Package Devices
Challenges of Package on Package Devices
Paper outlines the process associated with soldering stacked packages using dip flux and dip solder paste designed to overcome the incidence of package warp.
Program: Materials Tech
Assembly of Fine Pitch PoP Components
Assembly of Fine Pitch PoP Components
Paper focuses different assembly variations for PoP components with .4 mm pitch on the lower package and .5mm pitch on the upper package.
Program: Production Floor
Embedded Packaging Technologies
Embedded Packaging Technologies
Paper covers the design, packaging processes, and technology demonstrations of prototypes packaged using embedded technology.
Program: Materials Tech
Solder Bumping for Flip Chip Technology
Solder Bumping for Flip Chip Technology
Paper presents new cost-efficient solder bumping and adapted assembly technologies for processing flip-chips.
Program: Materials Tech
Flip Chip Package Qualification
Flip Chip Package Qualification
Paper reviews qualification efforts for solder interconnects on interposer substrates, X-ray and cross-sectional analysis of packages and process optimization efforts to improve reliability.
Program: Materials Tech
Investigation of Pad Cratering in Large Flip-Chip BGA
Investigation of Pad Cratering in Large Flip-Chip BGA
Study covers a technique used to systematically investigate pad cratering in a daisy chain flip-chip BGA package.
Program: Analysis Lab
New Technologies for Ultra Thin Chips
New Technologies for Ultra Thin Chips
Paper shows different approaches to use ultra-thin chips for new packages with high density and improved performance.
Program: Materials Tech
No-Clean Flux Residue and Underfill Compatibility
No-Clean Flux Residue and Underfill Compatibility
This paper covers an experiment designed to measure the electrical reliability of various combinations of underfill and no-clean flux residues.
Program: Materials Tech
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