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February 22, 2012
Lifted Leads on QFP Components
Program: Ask the Experts
Head-On-Pillow Defect - A Pain in the Neck
Program: Analysis Lab
False Tin Whiskers: Masquerading Intermetallic
Program: Analysis Lab
Cause of Unusual Contamination?
Program: Ask the Experts
Addressing Head-In-Pillow Defects
Program: Analysis Lab
What Causes Oxidation on SMT Pads?
Program: Ask the Experts
The Effects of Flux Residues on Reliability
Program: Analysis Lab
Head and Pillow SMT Failure Modes
Program: Analysis Lab
Elimination of Whiskers from Electroplated Tin
Program: Materials Tech
Fracture Prediction in Lead-Free Joints
Program: Analysis Lab
Mysterious Solder Balls
Program: Ask the Experts
Reducing Defects with Embedded Sensing
Program: Materials Tech
Effects of Whiskers on Nanocrystalline Copper
Program: Analysis Lab
Study of Tin Whisker Inhibiting Systems
Program: Analysis Lab
Pad Cratering Evaluation of PCBs
Program: Materials Tech
Hand Sanitizers and Risks to Electronics
Program: Analysis Lab
Pockets of Contamination
Program: Analysis Lab
Comparison of Solder Paste Residues
Program: Analysis Lab
Intermetallic Crystals and Role in Microbridges
Program: Analysis Lab
Solder Paste Residue Corrosivity Assessment
Program: Analysis Lab
Are Gloves Required for PCB Handling?
Program: Board Talk
Circuit Board Exposed to Rain
Program: Ask the Experts
Cause of Voids in Leadless Packages
Program: Ask the Experts
Stencil Issue with PLCC Component
Program: Ask the Experts
Early Detection of PCB Pad Cratering Failures
Program: Analysis Lab
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These programs cover problems and solutions associated with contamination, defects, tin whiskers and more.
Lifted Leads on QFP Components
After placement and reflow, we are having a random lifted lead problem on some QFP's. Is a 1% fall out rate normal? What might be the cause?
Program: Ask the Experts
Head-On-Pillow Defect - A Pain in the Neck
The head on pillow defect is becoming more common. This paper describes an occurrence for an OEM and explains how it was dealt with.
Program: Analysis Lab
False Tin Whiskers: Masquerading Intermetallic
Paper covers misidentification of tin/copper intermetallic structures as tin whiskers and soldering details during root cause analysis.
Program: Analysis Lab
Cause of Unusual Contamination?
We have 40 PCB assemblies with unusual contamination. Do you have any ideas what the contamination is, and what caused it?
Program: Ask the Experts
Addressing Head-In-Pillow Defects
The head-in-pillow defect has become a relatively common failure since the implementation of lead-free technologies. This paper addresses the three sources or contributing issues (supply, process & material) of head-in-pillow defects.
Program: Analysis Lab
What Causes Oxidation on SMT Pads?
What causes oxidation on surface mount pads? We believe oxidation on BGA pads is resulting in poor solder joints.
Program: Ask the Experts
The Effects of Flux Residues on Reliability
Paper discusses an experiment designed to mimic partially activated flux residues under component bodies and how it affects SIR performance.
Program: Analysis Lab
Head and Pillow SMT Failure Modes
This paper describes critical factors affecting head and pillow and how to identify the root cause and give potential solutions to prevent the defect.
Program: Analysis Lab
Elimination of Whiskers from Electroplated Tin
Paper covers data to show the effect of two approaches on the dissipation of the stress, resulting from intermetallic compound formation.
Program: Materials Tech
Fracture Prediction in Lead-Free Joints
Study examines applicability of solder joint fracture initiation criteria that would permit the prediction of solder joint strength.
Program: Analysis Lab
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